Electron diffraction mapping device - メーカー・企業と製品の一覧

[TEM ED-Map] TEM Electron Diffraction Mapping Method

This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).

By scanning the electron beam probe and measuring the electron diffraction patterns at each point, high spatial resolution crystal information can be obtained. This method allows for the acquisition of information on smaller crystal grains than the EBSD method in SEM. It is also referred to as ACOM (Automated Crystal Orientation Mapping) - TEM method. - Crystal grain size analysis is possible - Orientation measurement of the measurement area is possible - Observation of twin grain boundaries (corresponding grain boundaries) is possible - Extraction of specific crystal orientations is possible - Measurement of the rotation angle of adjacent crystal grains is possible - Evaluation of crystal grains larger than a few nanometers is possible

• 企業：一般財団法人材料科学技術振興財団　MST
• 価格：Other

• Contract measurement
• Contract Analysis